BError setTestMode(PuChannel puPhysChannel, BUInt32 testOutput, BUInt32 timingDisableMask); ///< The signal source for the digital test output connector. 0: None, 1: FrefDelayed, 2: PllFRef, 3: PllFRefHarm. The timingDisableMask bit mask defines which of the timing inputs should be disabled. If a timing input is disabled it can be still operated by software command.
BError setTimingSignals(PuChannel puPhysChannel, BUInt32 timingSignals); ///< This function sets the given timing signals to the values as defined in the timingSignals bit array.
BError captureDiagnostics(PuChannel puPhysChannel, TestCaptureInfo captureInfo, BArray<BUInt64>& data); ///< This function will capture test data
BError setTestData(PuChannel puPhysChannel, BInt32 on, BArray<BUInt32> data); ///< This function will set a PU channel to sample data from memory rather than the ADC's